High-speed microscope VW-9000
| High-speed microscope VW-9000 | |
| High-speed image analysis | Motion-graph based analysis |
| Compact design | Lens with integrated illumination and controller |
| Ease of operation | Simple/easy focus adjustment |
| Magnified observation | 3D display capability and high-magnification viewing |
| Zoom lens | 25–175×; 100–1000× |
| Stand | Free-angle stand |
Measuring microscope
| Measuring microscope | |
| Barrel/tube | Monocular; reticle projection method; switchable optical path |
| Observed image | Erect, correct-image |
| Measuring range | 300 × 100 mm |
| Top stage dimensions | 500 × 254 mm |
| Detector | High-precision digital scale |
| Minimum display/resolution | 1 µm |
Tensile testing machine
| Tensile Testing Machine DS2-20N/MX500N | |
| Maximum load | 20 N |
| Minimum resolution | 0.01 N |
| Accuracy | ±0.2% FS ±1 digit |
| Sampling rate | Up to 1000 samples/sec |
| Functions | P-P measurement; upper and lower limit judgment |
| Motorized stand speed | Variable 10–300 mm/min |
Analytical Electronic Balance HR-202i
| Analytical Electronic Balance HR-202i | |
| Capacity | 51 g |
| Minimum display | 0.00001 g |
| Stabilization time | 8 s |
| Weighing pan diameter | Ø80 mm |
| Operating temperature and humidity range | 5 °C to 40 °C; RH ≤ 85% |
Anterior Segment OCT — CASIA SS-1000
| Anterior Segment OCT — CASIA SS-1000 | |
| Operating principle | Wavelength-swept low-coherence interferometry |
| Full 3D | Complete three-dimensional acquisition of anterior segment structures |
| High resolution | 10 μm in depth (approximately 1/100th of MRI resolution) |
| Speed | 0.3–2.4 s per scan |
| Non-contact / Non-invasive | Uses infrared light for safety |